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Nose-to-Nose Oscilloscope Calibration Phase Error Inherent in the Sampling Circuitry

Published

Author(s)

Catherine A. Remley

Abstract

We use simulations to study the dependence of the phase error in the nose-to-nose oscilloscope calibration on the oscilloscope's sampling circuitry. We determine which components of the internal sampling circuitry of the oscilloscope contribute most significantly to errors in the nose-to-nose calibration. We then predict an expected range of phase errors from a range of realistic component values.
Conference Dates
December 5-6, 2002
Conference Location
Washington, DC
Conference Title
60th ARFTG Microwave Measurement Conference

Citation

Remley, C. (2002), Nose-to-Nose Oscilloscope Calibration Phase Error Inherent in the Sampling Circuitry, 60th ARFTG Microwave Measurement Conference, Washington, DC, [online], https://doi.org/10.1109/ARFTGF.2002.1218690 (Accessed May 16, 2022)
Created December 6, 2002, Updated January 27, 2020