Remley, C.
(2002),
Nose-to-Nose Oscilloscope Calibration Phase Error Inherent in the Sampling Circuitry, 60th ARFTG Microwave Measurement Conference, Washington, DC, [online], https://doi.org/10.1109/ARFTGF.2002.1218690
(Accessed October 13, 2024)
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Nose-to-Nose Oscilloscope Calibration Phase Error Inherent in the Sampling Circuitry
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Abstract
We use simulations to study the dependence of the phase error in the nose-to-nose oscilloscope calibration on the oscilloscope's sampling circuitry. We determine which components of the internal sampling circuitry of the oscilloscope contribute most significantly to errors in the nose-to-nose calibration. We then predict an expected range of phase errors from a range of realistic component values.Conference Dates
December 5-6, 2002
Conference Location
Washington, DC
Conference Title
60th ARFTG Microwave Measurement Conference
Pub Type
Conferences
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Created December 6, 2002, Updated January 27, 2020