Galambosi, S.
, Soininen, J.
, Hamalainen, K.
, Shirley, E.
and Kao, C.
(2001),
Nonresonant Inelastic X-Ray Scattering Study of Cubic Boron Nitride, Physical Review B (Condensed Matter and Materials Physics)
(Accessed March 13, 2025)
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Nonresonant Inelastic X-Ray Scattering Study of Cubic Boron Nitride
Published
Author(s)
S Galambosi, J A. Soininen, K Hamalainen, , C C. Kao
Abstract
During the recent years boron nitride has been extensively studied via numerous experimental techniques because it exhibits several fascinating characteristics such as semiconducting properties, extreme hardness, high thermal conductivity and large band gap. The optical properties of cBN have also drawn both experimental and theoretical interest.Citation
Physical Review B (Condensed Matter and Materials Physics)
Volume
64
Issue
No. 2
Pub Type
Journals
Keywords
boron nitride, inelastic x-ray scattering, non-resonant inelastic x-ray scattering, NRIXS, semiconductors
Citation
Issues
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Created June 30, 2001, Updated October 12, 2021