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Nonresonant Inelastic X-Ray Scattering Study of Cubic Boron Nitride

Published

Author(s)

S Galambosi, J A. Soininen, K Hamalainen, Eric L. Shirley, C C. Kao

Abstract

During the recent years boron nitride has been extensively studied via numerous experimental techniques because it exhibits several fascinating characteristics such as semiconducting properties, extreme hardness, high thermal conductivity and large band gap. The optical properties of cBN have also drawn both experimental and theoretical interest.
Citation
Physical Review B (Condensed Matter and Materials Physics)
Volume
64
Issue
No. 2

Keywords

boron nitride, inelastic x-ray scattering, non-resonant inelastic x-ray scattering, NRIXS, semiconductors

Citation

Galambosi, S. , Soininen, J. , Hamalainen, K. , Shirley, E. and Kao, C. (2001), Nonresonant Inelastic X-Ray Scattering Study of Cubic Boron Nitride, Physical Review B (Condensed Matter and Materials Physics) (Accessed April 20, 2024)
Created June 30, 2001, Updated October 12, 2021