Postek, M.
(1987),
Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope, Plenum Publ. Corp., (Accessed October 31, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope
Published
Author(s)
Citation
Review of Progress in NDE 6B
Publisher Info
Plenum Publ. Corp.,
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1987, Updated February 17, 2017