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PUBLICATIONS

Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope

Published

Author(s)

Michael T. Postek
Citation
Review of Progress in NDE 6B
Publisher Info
Plenum Publ. Corp.,
Pub Type
Books

Citation

Postek, M. (1987), Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope, Plenum Publ. Corp., (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1987, Updated February 17, 2017
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