Roenker, K.
(1984),
An NMOS test chip for a course in semiconductor parameter measurements:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.84-2822
(Accessed October 15, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
An NMOS test chip for a course in semiconductor parameter measurements:
Published
Author(s)
Citation
- NBS IR 84-2822
Report Number
NBS IR 84-2822
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1984, Updated May 19, 2023