Roenker, K.
(1984),
An NMOS test chip for a course in semiconductor parameter measurements:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.84-2822 (Accessed June 26, 2026)
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An NMOS test chip for a course in semiconductor parameter measurements:
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- NBS IR 84-2822
Report Number
NBS IR 84-2822
Pub Type
NIST Pubs
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Created January 1, 1984, Updated May 19, 2023