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NIST Mixed Stain Study 3: Signal Intensity Balance in Commercial Short Tandem Repeat Multiplexes

Published

Author(s)

David L. Duewer, Margaret C. Kline, Janette W. Redman, John M. Butler
Citation
Analytical Chemistry
Volume
76
Issue
23

Citation

Duewer, D. , Kline, M. , Redman, J. and Butler, J. (2004), NIST Mixed Stain Study 3: Signal Intensity Balance in Commercial Short Tandem Repeat Multiplexes, Analytical Chemistry (Accessed October 11, 2025)

Issues

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Created December 1, 2004, Updated February 19, 2017
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