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The NIST Metrology Program on Electromagentic Characterization of Materials

Published

Author(s)

Claude Weil
Proceedings Title
Proc., Symp. on Materials and Processes for Wireless Communication
Conference Dates
November 15-16, 1995
Conference Location
Boston, MA

Citation

Weil, C. (1995), The NIST Metrology Program on Electromagentic Characterization of Materials, Proc., Symp. on Materials and Processes for Wireless Communication, Boston, MA (Accessed July 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 1995, Updated February 19, 2017