Weil, C.
(1995),
The NIST Metrology Program on Electromagentic Characterization of Materials, Proc., Symp. on Materials and Processes for Wireless Communication, Boston, MA
(Accessed May 16, 2025)
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The NIST Metrology Program on Electromagentic Characterization of Materials
Published
Author(s)
Proceedings Title
Proc., Symp. on Materials and Processes for Wireless Communication
Conference Dates
November 15-16, 1995
Conference Location
Boston, MA
Pub Type
Conferences
Citation
Issues
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Created November 1, 1995, Updated February 19, 2017