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NIST-on-a-chip: the future of instrumentation and traceability

Published

Author(s)

Jay Hendricks, Barbara Goldstein

Abstract

The US National Institute of Standards and Technology's ‘NIST-on-a-CHIP' programme heralds a paradigm shift in scientific instrumentation. The vision of the programme is that instruments will be their own primary standard, and the concept of an unbroken chain of calibrations back to a national or international standard would be superseded. The new instruments will be rugged, cheap, and more accurate, thanks to developments in manufacturing techniques for integrated circuits.
Citation
<i>Quality Assurance for Scientists</i> (IOP Publising, LTD, No 2 The Distillery, Glassfields, Avon Street, Bristol BS2 0GR , Bristol, 20899, GB)
Publisher Info
IOP Publising, LTD, Bristol

Keywords

Metrology, Tracibility, NIST on a Chip, Quality Assurance, National Metrology Institute,

Citation

Hendricks, J. and Goldstein, B. (2024), NIST-on-a-chip: the future of instrumentation and traceability, IOP Publising, LTD, Bristol, [online], https://doi.org/10.1088/978-0-7503-5107-2, https://nps-ext.nist.gov/nps/nps_public_api/api/Publication/file/936535 (Accessed October 24, 2026)
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Created May 20, 2024, Updated October 2, 2026
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