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NIST-on-a-chip: the future of instrumentation and traceability

Published

Author(s)

Jay Hendricks, Barbara Goldstein

Abstract

The US National Institute of Standards and Technology's 'NIST-on-a-CHIP' programme heralds a paradigm shift in scientific instrumentation. The vision of the programme is that instruments will be their own primary standard, and the concept of an unbroken chain of calibrations back to a national or international standard would be superseded. The new instruments will be rugged, cheap, and more accurate, thanks to developments in manufacturing techniques for integrated circuits.
Citation
Quality Assurance for Scientists
Publisher Info
IOP Publising, LTD, Bristol,

Keywords

Metrology, Tracibility, NIST on a Chip, Quality Assurance, National Metrology Institute

Citation

Hendricks, J. and Goldstein, B. (2024), NIST-on-a-chip: the future of instrumentation and traceability, IOP Publising, LTD, Bristol, , [online], https://doi.org/10.1088/978-0-7503-5107-2, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936535 (Accessed October 4, 2026)
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Created May 20, 2024, Updated October 4, 2026
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