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PUBLICATIONS

New Technologies for Optical Radiation Measurements

Published

Author(s)

Yoshihiro Ohno
Proceedings Title
CIE 23rd Session
Conference Dates
November 1-8, 1995
Conference Location
New Delhi, IN
Conference Title
Proc. CIE 23rd Session
Pub Type
Conferences

Citation

Ohno, Y. (1995), New Technologies for Optical Radiation Measurements, CIE 23rd Session , New Delhi, IN (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1995, Updated February 17, 2017
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