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New photometer standards for low uncertainty illuminance scale realization

Published

Author(s)

George P. Eppeldauer, Carl C. Miller, Yoshihiro Ohno
Proceedings Title
26th Session of the CIE
Conference Dates
July 1, 2007
Conference Location
Beijing, CH
Conference Title
Proc. 26th Session of the CIE

Citation

Eppeldauer, G. , Miller, C. and Ohno, Y. (2007), New photometer standards for low uncertainty illuminance scale realization, 26th Session of the CIE , Beijing, CH (Accessed December 5, 2024)

Issues

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Created January 1, 2007, Updated February 17, 2017