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A New Monte Carlo Application for Complex Sample Geometries

Published

Author(s)

Nicholas W. Ritchie
Citation
Surface and Interface Analysis

Keywords

backscatter, electron beam, electron probe microanalysis, electron transport, Monte Carlo, SEM, spectrometry, x-ray

Citation

Ritchie, N. (2005), A New Monte Carlo Application for Complex Sample Geometries, Surface and Interface Analysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=831377 (Accessed May 18, 2022)
Created November 1, 2005, Updated February 19, 2017