Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A New Monte Carlo Application for Complex Sample Geometries

Published

Author(s)

Nicholas W. Ritchie
Citation
Surface and Interface Analysis

Keywords

backscatter, electron beam, electron probe microanalysis, electron transport, Monte Carlo, SEM, spectrometry, x-ray

Citation

Ritchie, N. (2005), A New Monte Carlo Application for Complex Sample Geometries, Surface and Interface Analysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=831377 (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 2005, Updated February 19, 2017