A New Monte Carlo Application for Complex Sample Geometries

Published: November 01, 2005

Author(s)

Nicholas W. Ritchie
Citation: Surface and Interface Analysis
Pub Type: Journals

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Keywords

backscatter, electron beam, electron probe microanalysis, electron transport, Monte Carlo, SEM, spectrometry, x-ray
Created November 01, 2005, Updated February 19, 2017