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Near-Field Polarimetric Characterization of Polymer Crystallites

Published

Author(s)

Lori S. Goldner, S N. Goldie, Michael J. Fasolka, F Renaldo, Jeeseong Hwang, Jack F. Douglas

Abstract

We use near-field polarimetry (NFP) to investigate thin film crystallites of isotactic polystyrene (iPS). NFP micrographs enabled quantitative optical characterization of the birefringence in these specimens with sub-diffraction limited resolution, resulting in novel observations. In particular, we detect evidence for radial strain in the depletion boundary surrounding the growth front, as well as evidence for tilt in the crystal axis and strain in the amorphous layers above and below the growth plane of the crystallites.
Citation
Applied Physics Letters
Volume
85
Issue
8

Keywords

depletion region, isotactic polystyrene, NSOM, polarimetry, polymer crystallization

Citation

Goldner, L. , Goldie, S. , Fasolka, M. , Renaldo, F. , Hwang, J. and Douglas, J. (2004), Near-Field Polarimetric Characterization of Polymer Crystallites, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841784 (Accessed July 14, 2024)

Issues

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Created August 1, 2004, Updated January 27, 2020