Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Nanoscale measurements of Poisson's ratio with contact-resonance atomic force microscopy

Published

Author(s)

Donna C. Hurley, J Turner

Abstract

We describe contact-resonance atomic force microscopy (AFM) methods to quantitatively measure Poisson's ratio v or shear modulus G at the same time as Young's modulus E. In contact-resonance AFM, the frequencies of the cantilever's resonant vibrations are measured while the tip is in contact with the sample. Simultaneous measurement of flexural and torsional vibrational modes enables E and v to be determined separately. Analysis methods are presented to relate the contact-resonance frequencies to the tip-sample contact stiffness, which in turn determines sample's nanoscale elastic properties. Experimental results are presented for a glass specimen using fused silica as a reference material. The agreement between our contact-resonance AFM measurements and values obtained from other means demonstrates the validity of the basic method.
Citation
Journal of Applied Physics
Volume
102
Issue
3

Keywords

atomic force microscopy, contact-resonance spectroscopy, elastic properties, Poisson ratio

Citation

Hurley, D. and Turner, J. (2007), Nanoscale measurements of Poisson's ratio with contact-resonance atomic force microscopy, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50507 (Accessed February 28, 2024)
Created August 8, 2007, Updated October 12, 2021