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Nanomechanical Characterization of Polymers Using Scanning Probe Microscopes

Published

Author(s)

Mark R. VanLandingham

Abstract

Scanning probe microscopy (SPM) has been used to study polymeric materials with nanometer spatial resolution. Indentation methods based on SPM technology include the use of cantilever probes with an atomic force microscope (AFM), depth-sensing transducers attached to an AFM, and the interfacial force microscope (IFM). In this paper, the use of indentation to measure the elastic modulus of polymeric materials using these SPM-based methods is presented. Modifications to current nanoindentation methods regarding curve fits to load-penetration (P-h) unloading curves, tip shape calibration, and viscoelasticity are discussed.
Proceedings Title
Proceedings of the 24th Annual Meeting of the Adhesion Society
Conference Dates
February 25-28, 2001
Conference Title
Adhesion Society Meeting

Keywords

atomic force microscopy, elastic modulus, interfacial force microscope, nanoindentation, polymers, tip shape calibration, viscoelastic behavior

Citation

VanLandingham, M. (2001), Nanomechanical Characterization of Polymers Using Scanning Probe Microscopes, Proceedings of the 24th Annual Meeting of the Adhesion Society (Accessed May 22, 2024)

Issues

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Created February 1, 2001, Updated February 19, 2017