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Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness

Published

Author(s)

B D. Vogt, Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, Wen-Li Wu

Abstract

Specular x-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25 ?C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from 3 to 200 nm. The equilibrium swelling of all the films irrespective of film thickness was 0.57 ? 0.03 volume fraction from both QCM and XR measurements. Although the equilibrium absorption is independent of thickness, the absorption kinetics substantially decrease for film thickness less than 100 nm. For the thinnest film (3 nm), there is a five order of magnitude decrease in the diffusion coefficient for water as determined by the absorption measurements.
Citation
Langmuir
Volume
20
Issue
No. 4

Keywords

absorption, thin films

Citation

Vogt, B. , Soles, C. , Lee, H. , Lin, E. and Wu, W. (2004), Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness, Langmuir, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852219 (Accessed July 24, 2024)

Issues

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Created February 1, 2004, Updated February 17, 2017