Marchiando, J.
, Lowney, J.
and Kopanski, J.
(1997),
Models for Interpreting Measurements Scanning Capacitance Microscope Measurements, Scanning Microscopy
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Models for Interpreting Measurements Scanning Capacitance Microscope Measurements
Published
Author(s)
, ,
Citation
Scanning Microscopy
Volume
11
Issue
1
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1997, Updated October 12, 2021