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Modeling Based Examination of Conducted EMI Emissions from Hard- and Soft-Switching PWM Inverters



Huibin Zhu, Jih-Sheng Lai, Yi-hua D. Tang, Allen R. Hefner Jr., Celia Chen


For the purpose of investigation of electromagnetic interference (EMI) mechanisms in hard- and soft-switching PWM inverters, empirical models and comparative experiments were studied in both time-domain and frequency-domain. Models of the major circuit components including switching devices, passive components and interconnects were obtained with physics-based device modeling and time-domain reflectometry (TDR) for parasitics characterization. The inverter simulation was then constructed with all the empirical models included, and the results were compared with actual experiments to examine the significant roles of parasitic elements coupled with device switching dynamics in EMI generations. With separation of common- and differential-mode EMIs, the validity of the modeling approach is demonstrated and the soft-switching effects on EMI are discussed.
Proceedings Title
Proc., IEEE Industrial Applications Society Meeting
Conference Dates
October 3-7, 1999
Conference Location
Phoenix, AZ, USA
Conference Title
IEEE Transactions on Industry Applications Society


device modeling, EMI, IGBT, interconnect metrology, time-domain, reflectometry


Zhu, H. , Lai, J. , Tang, Y. , Hefner Jr., A. and Chen, C. (1999), Modeling Based Examination of Conducted EMI Emissions from Hard- and Soft-Switching PWM Inverters, Proc., IEEE Industrial Applications Society Meeting, Phoenix, AZ, USA, [online], (Accessed May 27, 2024)


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Created October 2, 1999, Updated October 12, 2021