Modeling Based Examination of Conducted EMI Emissions from Hard- and Soft-Switching PWM Inverters

Published

October 3, 1999

Author(s)

Huibin Zhu, Jih-Sheng Lai, Yi-hua D. Tang, Allen R. Hefner Jr., Celia Chen

Abstract

For the purpose of investigation of electromagnetic interference (EMI) mechanisms in hard- and soft-switching PWM inverters, empirical models and comparative experiments were studied in both time-domain and frequency-domain. Models of the major circuit components including switching devices, passive components and interconnects were obtained with physics-based device modeling and time-domain reflectometry (TDR) for parasitics characterization. The inverter simulation was then constructed with all the empirical models included, and the results were compared with actual experiments to examine the significant roles of parasitic elements coupled with device switching dynamics in EMI generations. With separation of common- and differential-mode EMIs, the validity of the modeling approach is demonstrated and the soft-switching effects on EMI are discussed.

Proceedings Title

Proc., IEEE Industrial Applications Society Meeting

Conference Dates

October 3-7, 1999

Conference Location

Phoenix, AZ, USA

Conference Title

IEEE Transactions on Industry Applications Society

Pub Type

Conferences

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Local Download

Keywords

device modeling, EMI, IGBT, interconnect metrology, time-domain, reflectometry

Citation

Zhu, H. , Lai, J. , Tang, Y. , Hefner Jr., A. and Chen, C. (1999), Modeling Based Examination of Conducted EMI Emissions from Hard- and Soft-Switching PWM Inverters, Proc., IEEE Industrial Applications Society Meeting, Phoenix, AZ, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30162 (Accessed March 26, 2025)