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Modeling and Simulation of Resistivity of Nanometer Scale Copper

Published

Author(s)

Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona E. Zaghloul, David L. Blackburn
Citation
Microelectronics Reliability
Volume
46
Issue
7

Citation

Yarimbiyik, E. , Schafft, H. , Allen, R. , Zaghloul, M. and Blackburn, D. (2006), Modeling and Simulation of Resistivity of Nanometer Scale Copper, Microelectronics Reliability (Accessed April 18, 2024)
Created June 30, 2006, Updated October 12, 2021