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Modeling and Simulation of Resistivity of Nanometer Scale Copper
Published
Author(s)
Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona E. Zaghloul, David L. Blackburn
Citation
Microelectronics Reliability
Volume
46
Issue
7
Pub Type
Journals
Citation
Yarimbiyik, E.
, Schafft, H.
, Allen, R.
, Zaghloul, M.
and Blackburn, D.
(2006),
Modeling and Simulation of Resistivity of Nanometer Scale Copper, Microelectronics Reliability
(Accessed June 9, 2023)