Yarimbiyik, E.
, Schafft, H.
, Allen, R.
, Zaghloul, M.
and Blackburn, D.
(2006),
Modeling and Simulation of Resistivity of Nanometer Scale Copper, Microelectronics Reliability
(Accessed May 1, 2025)
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Modeling and Simulation of Resistivity of Nanometer Scale Copper
Published
Author(s)
, , , ,
Citation
Microelectronics Reliability
Volume
46
Issue
7
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 2006, Updated October 12, 2021