Model Tests to Investigate the Effects of Geometrical Imperfections on the NIST Calculable Capacitor

Published

April 23, 1999

Author(s)

Anne-Marie Jeffery, Lai H. Lee, John Q. Shields

Abstract

The calculable capacitor at National Institute of Standards and Technology (NIST) links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2 x 10^-8. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty. These included evaluations of the effect of eccentricity of the blocking electrodes used to define the capacitor's length and of uniform taper on all the calculable capacitor bars. In addition the effect of tilt of the blocking electrode and taper in three or fewer bars was investigated. A new cone-shape for the tip of the blocking electrode was also studied.

Citation

Model Tests to Investigate the Effects of Geometrical Imperfections on the NIST Calculable Capacitor

Volume

48

Issue

2

Pub Type

Journals

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Keywords

calculable capacitor, capacitance measurements, capacitance unit, eccentricity, geometrical imperfections

Citation

Jeffery, A. , Lee, L. and Shields, J. (1999), Model Tests to Investigate the Effects of Geometrical Imperfections on the NIST Calculable Capacitor, Model Tests to Investigate the Effects of Geometrical Imperfections on the NIST Calculable Capacitor, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13635 (Accessed December 2, 2024)