Wallis, T.
and Farina, M.
(2020),
Microwaves and Microscopy (Guest Editorial), IEEE Microwave Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930484
(Accessed April 27, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Microwaves and Microscopy (Guest Editorial)
Published
Author(s)
, Marco Farina
Abstract
Welcome to this special issue of IEEE Microwave Magazine, which is focused on the topic of Microwaves and Microscopy. As that title implies, this topic lies at the intersection of two technical disciplines, namely microwave engineering and measurements on microscopic length scales. Within the pages of this issue, there are many compelling images from a wide selection of application areas, including metal-oxide-semiconductor (MOS) devices, biological cells, acoustic wave devices, and novel materials like graphene.Citation
IEEE Microwave Magazine
Volume
21
Issue
10
Pub Type
Journals
Download Paper
Keywords
near-field, microwave measurements, nanotechnology, nanoelectronics, scanning microwave microscopy
Citation
Created September 15, 2020, Updated October 19, 2020