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Microwaves and Microscopy (Guest Editorial)

Published

Author(s)

Thomas M. Wallis, Marco Farina

Abstract

Welcome to this special issue of IEEE Microwave Magazine, which is focused on the topic of “Microwaves and Microscopy.” As that title implies, this topic lies at the intersection of two technical disciplines, namely microwave engineering and measurements on microscopic length scales. Within the pages of this issue, there are many compelling images from a wide selection of application areas, including metal-oxide-semiconductor (MOS) devices, biological cells, acoustic wave devices, and novel materials like graphene.
Citation
IEEE Microwave Magazine
Volume
21
Issue
10

Keywords

near-field, microwave measurements, nanotechnology, nanoelectronics, scanning microwave microscopy

Citation

Wallis, T. and Farina, M. (2020), Microwaves and Microscopy (Guest Editorial), IEEE Microwave Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930484 (Accessed June 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 15, 2020, Updated October 19, 2020