Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD

Published

January 1, 2003

Author(s)

Jon R. Pratt, David B. Newell, John A. Kramar, Douglas T. Smith

Abstract

This paper provides an overview of recent efforts at the National Institute of Standards and TEchnology to develop metrology and standards to support general users of instrumented indentation and scan-probe devices. Research directed towards a primary realization of force in the regime below 10 micronewton, developemtn and characterization of novel compact microforce sensors, scan-probe force calibration, and standardizaiton of instrumented indentation practices and calibration procedures will be presented. Descriptions of various laboratories and facilities will also be highlighted.

Proceedings Title

Proceedings of the Society for Experimental Mechanics Annual Meeting on Experimental Mechanics

Conference Dates

June 2-May 4, 2003

Conference Location

Charlotte, NC

Conference Title

Society for Experimental Mechanics Annual Meeting on Experimental Mechanics

Pub Type

Conferences

Keywords

atomic force microscope, force calibration, microforce, nanoindentation, nanonewton

Citation

Pratt, J. , Newell, D. , Kramar, J. and Smith, D. (2003), Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD, Proceedings of the Society for Experimental Mechanics Annual Meeting on Experimental Mechanics, Charlotte, NC (Accessed November 7, 2025)