Microdisplay Metrology Research at NIST

Published

September 14, 2001

Author(s)

Paul A. Boynton

Abstract

Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, the instruments suffer the effects of veiling glare or lens flare, thereby inaccurately measuring the luminance or color, especially for darker luminances. Projection display systems, an application of microdisplays, can be subject to ambient and reflected light contributions as well. Adequately characterizing the reflection properties of a raw microdisplay can also prove difficult due to the presence of the haze component. Several tools, diagnostics, and methodologies under investigation at NIST will be presented and discussed.

Proceedings Title

Proc of the Scottish Optoelectronics Asso/Soc for Information Display Conf & Wks

Conference Dates

September 13-14, 2001

Conference Location

Edinburgh, UK

Conference Title

Scottish Optoelectronics Association (SOA)/Society for Information Display (SID) Conference and Workshop on Microdisplays and their Applications

Pub Type

Conferences

Keywords

microdisplay measurements, projection display metrology, reflection metrology, simulated eye design, stray light, veiling glare

Citation

Boynton, P. (2001), Microdisplay Metrology Research at NIST, Proc of the Scottish Optoelectronics Asso/Soc for Information Display Conf & Wks, Edinburgh, UK (Accessed July 26, 2024)