Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Microdisplay Metrology Research at NIST



Paul A. Boynton


Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, the instruments suffer the effects of veiling glare or lens flare, thereby inaccurately measuring the luminance or color, especially for darker luminances. Projection display systems, an application of microdisplays, can be subject to ambient and reflected light contributions as well. Adequately characterizing the reflection properties of a raw microdisplay can also prove difficult due to the presence of the haze component. Several tools, diagnostics, and methodologies under investigation at NIST will be presented and discussed.
Proceedings Title
Proc of the Scottish Optoelectronics Asso/Soc for Information Display Conf & Wks
Conference Dates
September 13-14, 2001
Conference Location
Edinburgh, UK
Conference Title
Scottish Optoelectronics Association (SOA)/Society for Information Display (SID) Conference and Workshop on Microdisplays and their Applications


microdisplay measurements, projection display metrology, reflection metrology, simulated eye design, stray light, veiling glare


Boynton, P. (2001), Microdisplay Metrology Research at NIST, Proc of the Scottish Optoelectronics Asso/Soc for Information Display Conf & Wks, Edinburgh, UK (Accessed May 24, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created September 14, 2001, Updated February 19, 2017