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Metrology for Optoelectronics

Published

Author(s)

Gordon W. Day
Proceedings Title
Proc., SPIE, Conf. on Design, Fabrication, and Characterization of Photonic Devices,
Volume
3896
Issue
6
Conference Dates
November 30-December 3, 1999
Conference Location
Singapore, SN

Citation

Day, G. (1999), Metrology for Optoelectronics, Proc., SPIE, Conf. on Design, Fabrication, and Characterization of Photonic Devices,, Singapore, SN (Accessed March 1, 2024)
Created December 1, 1999, Updated January 27, 2020