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Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry
Published
Author(s)
David G. Seiler, John S. Suehle
Abstract
This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.
Seiler, D.
and Suehle, J.
(2006),
Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry, Semiconductor International
(Accessed October 7, 2025)