Fong, J.
(2004),
A Metrology-based Uncertainty Analysis Approach to V&V of Computer Models of High-consequence Engineering Systems, Invited Talk at Foundations 04: A Workshop for V&V in the 21st Century, Tempe, AZ
(Accessed January 25, 2025)
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A Metrology-based Uncertainty Analysis Approach to V&V of Computer Models of High-consequence Engineering Systems
Published
Author(s)
Proceedings Title
Invited Talk at Foundations 04: A Workshop for V&V in the 21st Century
Conference Location
Tempe, AZ
Pub Type
Conferences
Citation
Issues
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Created October 1, 2004, Updated February 19, 2017