Method to determine the absorbance of thin films for photovoltaic technology

Published

June 20, 2010

Author(s)

Nathan A. Tomlin, John H. Lehman, Katherine E. Hurst, D. B. Tanner, K. Kamaras, Aron Pekker

Abstract

We have demonstrated a novel method to determine optical properties of opaque or semi-transparent films for photovoltaic (PV) applications. Such films may be the basis of transparent conductors or photoconductive material. As an example, we measure the absolute absorptance (at visible and near infrared wavelengths) of an optically thick single-wall carbon nanotube (SWCNT) film by using a pyroelectric detector. This novel method obviates the need for analysis with respect to polarization and associated difficulties of ellipsometry. The Kramers-Kronig relation is used to determine the thick film index of refraction, which we use to calculate the optical properties of thin films as a function of thickness. A transmittance measurement obtained a from a thin SWCNT films show excellent agreement with results from our model.

Proceedings Title

Proceeding of the 2010 IEEE Photovoltaic Specialists Conference

Conference Dates

June 20-25, 2010

Conference Location

Waikiki, HI

Conference Title

2010 IEEE Photovoltaic Specialists Conference

Pub Type

Conferences

Keywords

absorbance, Kramers-Kronig, photovoltaic, thin film

Citation

Tomlin, N. , Lehman, J. , Hurst, K. , Tanner, D. , Kamaras, K. and Pekker, A. (2010), Method to determine the absorbance of thin films for photovoltaic technology, Proceeding of the 2010 IEEE Photovoltaic Specialists Conference, Waikiki, HI (Accessed December 10, 2024)