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MEMS length and strain round robin results with uncertainty analysis:

Published

Author(s)

Janet C Marshall, Robert I Scace, Winthrop A Baylies
Citation
- NIST IR 7291
Report Number
NIST IR 7291

Citation

Marshall, J. , Scace, R. and Baylies, W. (2006), MEMS length and strain round robin results with uncertainty analysis:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7291 (Accessed April 14, 2024)
Created January 1, 2006, Updated May 20, 2023