Rogers, G.
and Sawyer, D.
(1975),
Measurement of transistor scattering parameters:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-5
(Accessed May 9, 2025)
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Measurement of transistor scattering parameters:
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- NBS SP 400-5
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NBS SP 400-5
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NIST Pubs
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Created January 1, 1975, Updated May 19, 2023