Rogers, G.
and Sawyer, D.
(1975),
Measurement of transistor scattering parameters:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-5
(Accessed June 8, 2023)
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Measurement of transistor scattering parameters:
Published
Author(s)
,
Citation
- NBS SP 400-5
Report Number
NBS SP 400-5
Pub Type
NIST Pubs
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Citation
Created January 1, 1975, Updated May 19, 2023