Blackburn, D.
, Koyama, R.
, Oattinger, F.
and Rogers, G.
(1977),
Measurement techniques for high power semiconductor materials and devices ::annual report, January 1 to December 31, 1976, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.77-1249
(Accessed January 17, 2025)
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Measurement techniques for high power semiconductor materials and devices ::annual report, January 1 to December 31, 1976
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- NBS IR 77-1249
Report Number
NBS IR 77-1249
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NIST Pubs
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Created January 1, 1977, Updated May 19, 2023