Oettinger, F.
and Larrabee, R.
(1980),
Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1978 to September 30, 1979, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.80-2061
(Accessed October 13, 2024)
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Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1978 to September 30, 1979
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- NBS IR 80-2061
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NBS IR 80-2061
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NIST Pubs
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Created January 1, 1980, Updated May 19, 2023