Larrabee, R.
, Phillips, W.
and Thurber, W.
(1981),
Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1979 to September 30, 1980, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.81-2325
(Accessed April 23, 2024)
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Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1979 to September 30, 1980
Published
Author(s)
, ,
Citation
- NBS IR 81-2325
Report Number
NBS IR 81-2325
Pub Type
NIST Pubs
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Citation
Created January 1, 1981, Updated May 19, 2023