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Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standard

Published

Author(s)

Alain Rufenacht, Charles J. Burroughs, Paul D. Dresselhaus, Samuel P. Benz

Abstract

The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and the resulting multiple leakage paths, the quantities "leakage resistance" and "leakage current" are not necessarily equivalent. A method to measure and model the leakage current to ground for a given PJVS output voltage is presented. By upgrading simple components of the NIST system, the leakage current to ground can be reduced from 250 pA to 50 pA at 10 V.
Proceedings Title
Conference on Precision Electromagnetic Measurements, Conference Digest
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO
Conference Title
CPEM 2020

Keywords

Josephson-junction arrays, measurement techniques, precision measurements, standards, superconducting integrated circuits, voltage measurement, programmable Josephson voltage standards, PJVS, parallel biasing scheme, leakage resistance, leakage current

Citation

Rufenacht, A. , Burroughs, C. , Dresselhaus, P. and Benz, S. (2018), Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standard, Conference on Precision Electromagnetic Measurements, Conference Digest, Denver, CO, [online], https://doi.org/10.1109/CPEM.2018.8500911 (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 7, 2018, Updated July 10, 2020