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Measurement-Induced Entanglement in Noisy 2D Random Circuits

Published

Author(s)

Zhi-Yuan Wei, Jon Nelson, Joel Rajakumar, Esther Cruz, Alexey Gorshkov, Michael Gullans, Daniel Malz

Abstract

We study measurement-induced entanglement generated by column-by-column sampling of noisy, shallow 2D random Clifford circuits. Focusing on the operator entanglement Sop of the sampling induced boundary state, first, we reproduce in the noiseless limit a finite-depth transition from area to volume-law scaling. With on-site probablistic trace noise at any constant rate p > 0, the maximal Sop attained along the sampling trajectory obeys an area law in the boundary length and grows approximately linearly with the circuit depth T. By analyzing the spatial distribution of stabilizer generators, we observe exponential localization of stabilizer generators; this both accounts for the scaling of the maximal Sop and implies an exponential decay of conditional mutual information across buffered tripartitions, which we also confirm numerically. Together, these results indicate that constant local noise destroys long-range, volume-law measurement-induced entanglement in 2D random Clifford circuits.
Citation
PRX Quantum
Volume
7
Issue
3

Keywords

Quantum algorithms, computational physics, open quantum systems

Citation

Wei, Z. , Nelson, J. , Rajakumar, J. , Cruz, E. , Gorshkov, A. , Gullans, M. and Malz, D. (2026), Measurement-Induced Entanglement in Noisy 2D Random Circuits, PRX Quantum, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961056 (Accessed October 6, 2026)
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Created August 5, 2026, Updated October 5, 2026
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