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PUBLICATIONS

Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures

Published

Author(s)

Adam Pintar, Andrew Madison, Craig Copeland, Natalia Farkas, Samuel Stavis
Citation
ACS Nano
Pub Type
Journals

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Statistical analysis, Nanometrology and Nanobiotechnology

Citation

Pintar, A. , Madison, A. , Copeland, C. , Farkas, N. and Stavis, S. (2026), Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures, ACS Nano, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956400 (Accessed September 16, 2026)
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Created August 6, 2026, Updated September 15, 2026
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