Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Mapping Polymeric Properties Using Combinatorial and High-Throughput Methods: Adhesion and Mechanical Properties

Published

Author(s)

Aaron M. Forster, A Chiche, Martin Chiang, Christopher Stafford, Alamgir Karim

Abstract

High-throughput and combinatorial methods unlock novel approaches to investigations of new materials, allowing the materials community to carry out studies that promise greater efficiency to materials discovery and optimization. To this end, we have developed a suite of test methods to probe the adhesive and mechanical properties of polymer coatings and interfaces. This presentation will describe the efforts of the NIST Combinatorial Methods Center to develop a multi-lens adhesion test, combinatorial peel test, combinatorial edge delamination test, and a thin film modulus measurement.
Proceedings Title
Society of Plastics Engineers, Annual Technical Conference| 62nd Volume II | ANTEC 2004: Annual Technical Conference Proceedings | Society of Plastics Engineers
Volume
301(2)
Conference Dates
May 15-16, 2004
Conference Location
Undefined
Conference Title
ANTEC (Society of Plastics Engineers. Technical Conference)

Keywords

adhesion, edge delamination, JKR, m-ELF, mechanical measurement, modulus, peel test, PSA, SIEBIMM

Citation

Forster, A. , Chiche, A. , Chiang, M. , Stafford, C. and Karim, A. (2004), Mapping Polymeric Properties Using Combinatorial and High-Throughput Methods: Adhesion and Mechanical Properties, Society of Plastics Engineers, Annual Technical Conference| 62nd Volume II | ANTEC 2004: Annual Technical Conference Proceedings | Society of Plastics Engineers, Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852270 (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 2004, Updated October 12, 2021