Hurley, D.
, Kopycinska-Mueller, M.
and Kos, T.
(2007),
Mapping Mechanical Properties on the Nanoscale with Atomic Force Acoustic Microscopy, Jom, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50435
(Accessed October 8, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Mapping Mechanical Properties on the Nanoscale with Atomic Force Acoustic Microscopy
Published
Author(s)
, , Tony B. Kos
Abstract
We are developing tools that use the atomic force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic force acoustic microscopy (AFAM) involve the vibrational modes of the AFM cantilever when its tip is in contact with a material. These methods enable quantitative maps of local mechanical properties such as elastic modulus and thin-film adhesion. The information obtained furthers our understanding of patterned surfaces, thin films, and nanoscale structures.Citation
Jom
Volume
59
Issue
1
Pub Type
Journals
Download Paper
Keywords
atomic force microscopy, mechanical properties, atomic force acoustic microscopy, nanomechanics
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 30, 2007, Updated October 12, 2021