NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Magnetic field dependence of the critical current anisotropy in normal metal-YBa,Cu307-delta thin-film bilayers
Published
Author(s)
Ronald H. Ono, Loren F. Goodrich, James A. Beall, Marcus Johansson, Carl D. Reintsema
Abstract
We have measured the transport critical current density (Jc) in epitaxial quality films of YBa2Cu307-delta some of which were covered by thin (10 nm) Ag films. The films, both with and without Ag, had J, values greater than IO^6 A/cm^2 in liquid nitrogen. The effect of the Ag was to greatly reduce the dependence of J, on external magnetic fields in the case where the field was oriented in the plane of the film, that is, perpendicular to the c axis. It is unlikely that the effect is simply due to altered surface pinning, although qualitative agreement with critical state models is observed.
Ono, R.
, Goodrich, L.
, Beall, J.
, Johansson, M.
and Reintsema, C.
(1991),
Magnetic field dependence of the critical current anisotropy in normal metal-YBa,Cu307-delta thin-film bilayers, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905534
(Accessed October 11, 2025)