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Magnetic and Structural Characterization and Ferromagnetic Resonance Study of Thin Film HITPERM Soft Magnetic Materials for Data Storage Applications

Published

Author(s)

Hideyuki Okumura, D J. Twisselmann, Robert McMichael, M Q. Huang, Y N. Hsu, D E. Laughlin, M E. McHenry

Abstract

HITPERM/SiO2 single and multilayer thin films have been produced using a target composition of (Fe70Co30)88}Zr7}B4}Cu1}. The as-deposited HITPERM film contains small bcc (or B2) nanocrystals of volume fraction less than 10% surrounded by an amorphous matrix. The lattice parameter of the nanocrystal is about 5% larger than an equilibrium FeCo phase. The saturation induction determined from FMR measurements (1.53 0.08 T) is consistent with VSM and SQUID measurements (1.45-1.5 T) and also with as-spun amorphous ribbons (1.55-1.62 T). The Lande g-factors (2.15 0.05)are typical of transition metals, particularly, of Fe. The Landau-Lifshitz-Gilbert damping parameters of the single and Multilayered films are small (α = 0.0055 0.0004) with each layer acting almost independently. Neither thickness variation of each layer nor the number of stacking significantly affects the damping process in a range of film thicknesses of 50-150 nm, while the coercivities are strongly dependent on those parameters. The supports a notion that the damping parameter is an intrinsic property
Citation
Journal of Applied Physics
Volume
93
Issue
No. 10

Keywords

data storage, ferromagnetic resonance, multilayer films, nanocomposite soft magnet

Citation

Okumura, H. , Twisselmann, D. , McMichael, R. , Huang, M. , Hsu, Y. , Laughlin, D. and McHenry, M. (2003), Magnetic and Structural Characterization and Ferromagnetic Resonance Study of Thin Film HITPERM Soft Magnetic Materials for Data Storage Applications, Journal of Applied Physics (Accessed July 25, 2024)

Issues

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Created April 30, 2003, Updated October 12, 2021