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Low Angle Grain Boundary Dewetting in Sapphire

Published

Author(s)

B Hockey, M K. Kang, Sheldon M. Wiederhorn, J Blendell

Abstract

The structure and composition of low angle grainboundaries produced in sapphire by a liquid phase sintering process were investigated by conventional and high resolution transmission electron microscopy (CTEM and HRTEM, respectively). Considering the current emphasis on producing ceramics with textured microstructures for various applications, the question of grainboundary wetting vs. dewetting has become a relevant issue to determining the microstructure development and the properties of these liquid phase sintered materials. Accordingly, the present study was designed to cover a wide range of tile misorientations, twist misorientations, and boundary orientations.
Citation
Microscopy and Microanalysis

Keywords

dewetting, grainboundaries, sapphire, transmission electron microscopy

Citation

Hockey, B. , Kang, M. , Wiederhorn, S. and Blendell, J. (2001), Low Angle Grain Boundary Dewetting in Sapphire, Microscopy and Microanalysis (Accessed April 20, 2024)
Created August 1, 2001, Updated February 19, 2017