Hockey, B.
, Kang, M.
, Wiederhorn, S.
and Blendell, J.
(2001),
Low Angle Grain Boundary Dewetting in Sapphire, Microscopy and Microanalysis
(Accessed March 28, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Low Angle Grain Boundary Dewetting in Sapphire
Published
Author(s)
, , ,
Abstract
The structure and composition of low angle grainboundaries produced in sapphire by a liquid phase sintering process were investigated by conventional and high resolution transmission electron microscopy (CTEM and HRTEM, respectively). Considering the current emphasis on producing ceramics with textured microstructures for various applications, the question of grainboundary wetting vs. dewetting has become a relevant issue to determining the microstructure development and the properties of these liquid phase sintered materials. Accordingly, the present study was designed to cover a wide range of tile misorientations, twist misorientations, and boundary orientations.Citation
Microscopy and Microanalysis
Pub Type
Journals
Keywords
dewetting, grainboundaries, sapphire, transmission electron microscopy
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 1, 2001, Updated February 19, 2017