Postek, M.
(1990),
Low Accelerating Voltage SEM Imaging and Metrology Using Backscattered Electrons, Review of Scientific Instruments
(Accessed March 16, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Low Accelerating Voltage SEM Imaging and Metrology Using Backscattered Electrons
Published
Author(s)
Citation
Review of Scientific Instruments
Volume
61
Issue
12
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 1, 1990, Updated February 17, 2017