Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Locally controlled magnetic anisotropy in transcritical permalloy thin films using ferroelectric BaTiO3 domains

Published

Author(s)

Michael J. Donahue, Sean W. Fackler, Tieren Gao, Paris N. Nero, Sang-Wook Cheong, John Cumings, Ichiro Takeuchi

Abstract

We investigated the local coupling between dense magnetic stripe domains in transcritical permalloy (tPy) thin films and ferroelectric domains of BaTiO3 single crystals in a tPy/BaTiO3 heterostructure. Two distinct changes in the magnetic stripe domains of tPy were observed from the magnetic force microscopy images after cooling the heterostructure from above the ferroelectric Curie temperature of BaTiO3 (120°C) to room temperature. First, an abrupt break in the magnetic stripe domain direction was found at the ferroelectric a-c-domain boundaries due to an induced change in in-plane magnetic anisotropy. Second, the magnetic stripe domain period increased when coupled to a ferroelectric a-domain due to a change in out-of-plane magnetic anisotropy. Micromagnetic simulations reveal that local magnetic anisotropy energy from inverse magnetostriction is conserved between in-plane and out-of-plane components.
Citation
Applied Physics Letters

Keywords

transcritical permalloy, ferroelectric, stripe domains, MFM, micromagnetics

Citation

Donahue, M. , Fackler, S. , Gao, T. , Nero, P. , Cheong, S. , Cumings, J. and Takeuchi, I. (2014), Locally controlled magnetic anisotropy in transcritical permalloy thin films using ferroelectric BaTiO3 domains, Applied Physics Letters, [online], https://doi.org/10.1063/1.4902809, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=917314 (Accessed December 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 25, 2014, Updated January 4, 2022