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Leveraging Combinatorial Coverage in the Machine Learning Product Lifecycle
Published
Author(s)
Jaganmohan Chandrasekaran, erin lanus, tyler cody, laura freeman, Raghu N. Kacker, M S Raunak, D. Richard Kuhn
Abstract
The data-intensive nature of machine learning (ML)-enabled systems introduces unique challenges in test and evaluation. We present an overview of combinatorial coverage, exploring its applications across the ML-enabled system lifecycle and its potential to address key limitations in performing test and evaluation for ML-enabled systems.
Chandrasekaran, J.
, Lanus, E.
, cody, T.
, Freeman, L.
, Kacker, R.
, Raunak, M.
and Kuhn, D.
(2024),
Leveraging Combinatorial Coverage in the Machine Learning Product Lifecycle, Computer (IEEE Computer), [online], https://doi.org/10.1109/MC.2024.3366142, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936815
(Accessed October 3, 2025)