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Leakage current pathways in Josephson Arbitrary Waveform Synthesizer Standards

Published

Author(s)

Raegan Johnson, Jesus Mejia, Alain Rufenacht, Anna Fox, Nathan Flowers-Jacobs, Paul Dresselhaus, Samuel Benz
Proceedings Title
Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
July 6-11, 2024
Conference Location
Denver, CO, US
Conference Title
NCSLI/CPEM Workshop & Symposium 2024

Keywords

Digital-analog conversion, leakage currents, measurement uncertainty, Josephson junction arrays, standards, superconducting integrated circuits, voltage measurement.

Citation

Johnson, R. , Mejia, J. , Rufenacht, A. , Fox, A. , Flowers-Jacobs, N. , Dresselhaus, P. and Benz, S. (2024), Leakage current pathways in Josephson Arbitrary Waveform Synthesizer Standards, Conference on Precision Electromagnetic Measurements (CPEM), Denver, CO, US, [online], https://doi.org/10.1109/CPEM61406.2024.10646083, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957315 (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 30, 2024, Updated October 31, 2024