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PUBLICATIONS

Laboratory-Based Reference Channels for Millimeter-Wave Wireless Device Measurements

Published

Author(s)

Joshua Kast, Paritosh Manurkar, Sudantha Perera, Mohamed Hany, Rob Horansky, Rick Candell, Kate Remley, Matt Simons

Abstract

Industrial and consumer wireless devices increasingly make use of millimeter-wave (mmWave) frequencies to meet increasing requirements for bandwidth, device density, and latency. The complex propagation environment and design of phased-array antennas pose a dual challenge to mmWave implementation. We have developed a mmWave testbed for industrial internet-of-things devices, which implements realistic mmWave channels in a repeatable and enclosed environment. Synthetic-aperture techniques are used to capture real-world channel information, replicate key channel features within our testbed, and, ultimately, will provide a traceable reference measurement against which mmWave devices may be compared. In this paper, an overview of the testbed is presented, and initial measurement results are provided for an "exemplar" industrial mmWave channel.
Conference Dates
May 20-23, 2024
Conference Location
Boulder, CO, US
Conference Title
2024 NIST/IEEE Conference on Computational Imaging Using Synthetic Apertures
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/CISA60639.2024.10576590
Local Download

Keywords

Industrial Internet of Things, Millimeter-wave Wireless, Over-the-Air Testing, Synthetic Aperture, Wireless communication
Wireless (RF), Internet of Things (IoT) and Factory communications

Citation

Kast, J. , Manurkar, P. , Perera, S. , Hany, M. , Horansky, R. , Candell, R. , Remley, K. and Simons, M. (2024), Laboratory-Based Reference Channels for Millimeter-Wave Wireless Device Measurements, 2024 NIST/IEEE Conference on Computational Imaging Using Synthetic Apertures, Boulder, CO, US, [online], https://doi.org/10.1109/CISA60639.2024.10576590, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957487 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 3, 2024, Updated July 18, 2024