Label-free hyperspectral dark-field microscopy towards quantitative scatter imaging
Philip Cheney, David McClatchy III, Stephen Kanick, Paul Lemaillet, David W. Allen, Daniel Samarov, Brian Pogue, Jeeseong C. Hwang
A hyperspectral dark-field microscopy technique has been developed for imaging spatially distributed diffuse reflectance spectra from light-scattering samples. In this report, quantitative scatter spectroscopy was demonstrated with a uniform scattering phantom, a solution of polystyrene microspheres. A Monte Carlo-based inverse model was used to calculate the reduced scattering coefficients of the samples of different microsphere concentrations from wavelength-dependent backscattered signal measured by the dark-field microscopy. The result was compared with the measurement result by a NIST's double integrating sphere system for validation. Ongoing efforts involve quantitative mapping of scattering and absorption coefficients in samples with spatially heterogeneous optical properties.
, McClatchy III, D.
, Kanick, S.
, Lemaillet, P.
, Allen, D.
, Samarov, D.
, Pogue, B.
and Hwang, J.
Label-free hyperspectral dark-field microscopy towards quantitative scatter imaging, Proceedings of SPIE, [online], https://doi.org/10.1117/12.2263336
(Accessed December 1, 2023)