L-Edge Spectroscopy of Dilute, Radiation-Sensitive Systems Using a Transition-Edge-Sensor Array
Daniel S. Swetz, William B. Doriese, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Galen C. O'Neil, Joel N. Ullom
We present X-ray absorption spectroscopy and resonant inelastic X-ray scattering (RIXS) measurements on the iron L-edge of 0.5 mM aqueous ferricyanide. These measurements demonstrate the ability of high-throughput transition- edge-sensor (TES) spectrometers to access the rich soft X-ray (1002000 eV) spectroscopy regime for dilute and radiation-sensitive samples. Our low-concentration data are in agreement with high-concentration measurements recorded by conventional grating-based spectrometers. These results show that soft X-ray RIXS spectroscopy acquired by high- throughput TES spectrometers can be used to study the local electronic structure of dilute metal- centered complexes relevant to biology, chemistry and catalysis. In particular, TES spectrometers have a unique ability to characterize frozen solutions of radiation- and temperature-sensitive samples.