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Jim, Our Mentor: Inspiring Our Data-driven Sensitivity Analysis for Real-world Problems and Our Lives

Published

Author(s)

Yooyoung Lee, Peter Fontana

Abstract

Jim Filliben has inspired many scientists in a variety of domains across the National Institute of Standard and Technology (NIST) with his statistical data analysis. In our talk we will highlight the impact of his insights and methodologies on our projects. He has also mentored and touched many people to thrive both inside and outside of their work. We share some of our memories of him and his inspirations.

Citation

Lee, Y. and Fontana, P. (2023), Jim, Our Mentor: Inspiring Our Data-driven Sensitivity Analysis for Real-world Problems and Our Lives (Accessed October 12, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created July 20, 2023
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