Hickernell, R.
, Sanford, N.
and Christensen, D.
(1991),
Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation, Proc. Intl. Soc. for Optical Engineering (SPIE), Undefined
(Accessed May 3, 2024)
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Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation
Published
Author(s)
, ,
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Volume
1474
Conference Location
Undefined
Pub Type
Conferences
Citation
Created December 31, 1990, Updated October 12, 2021