NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation
Published
Author(s)
Robert K. Hickernell, Norman Sanford, David H. Christensen
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Volume
1474
Conference Location
Undefined
Pub Type
Conferences
Citation
Hickernell, R.
, Sanford, N.
and Christensen, D.
(1991),
Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation, Proc. Intl. Soc. for Optical Engineering (SPIE), Undefined
(Accessed October 2, 2025)