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Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation

Published

Author(s)

Robert K. Hickernell, Norman Sanford, David H. Christensen
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Volume
1474
Conference Location
Undefined

Citation

Hickernell, R. , Sanford, N. and Christensen, D. (1991), Issues Affecting the Characterization of Integrated Optical Devices Subjected to Ionizing Radiation, Proc. Intl. Soc. for Optical Engineering (SPIE), Undefined (Accessed May 21, 2024)

Issues

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Created December 31, 1990, Updated October 12, 2021