Gaitan, M.
, Mayergoyz, I.
and Korman, C.
(1990),
Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method, IEEE Transactions on Electron Devices (Accessed April 30, 2026)
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Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method
Published
Author(s)
, I. D. Mayergoyz, C. E. Korman
Citation
IEEE Transactions on Electron Devices
Pub Type
Journals
Citation
Issues
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Created April 29, 1990, Updated October 12, 2021