An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials

Published

August 4, 2012

Author(s)

Thomas H. Gnaupel-Herold, Adam A. Creuziger, Mark A. Iadicola

Abstract

The determination of residual or applied stress through X-ray or neutron diffraction is generally regarded as a mature method. Most x-ray diffractometers can be used to perform a measurement of lattice strain vs. tilt angle, which is then converted into stress. The apparent simplicity of the conversion (the sin²ψ law comes to mind) betrays the fact that elastic and plastic anisotropy often cause aberrations of varying magnitude. This investigation focuses on the role of the diffraction elastic constants, the methods of their calculation in the presence of preferred orientation, and the accuracy at which stresses can be determined in the presence of preferred orientation.

Proceedings Title

Advances in X-ray Analysis

Volume

55

Conference Dates

August 1-5, 2011

Conference Location

Colorado Springs

Conference Title

60th Denver X-ray Conference

Pub Type

Conferences

Keywords

Accuracy, Stress Measurement, Diffraction, Preferred Orientation

Citation

Gnaupel-Herold, T. , Creuziger, A. and Iadicola, M. (2012), An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials, Advances in X-ray Analysis, Colorado Springs, -1 (Accessed October 20, 2025)