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Introduction to Journal of Modern Optics Special Issue on Single-Photon Devices and Applications

Published

Author(s)

Stefan Kueck, Alan L. Migdall, Ivo P. Degiovanni, Jessica Cheung

Abstract

This special issue accompanies the 5th international conference on single-photon technologies held at the Physikalisch-Technische Bundesanstalt (PTB), Germany, in June 2011. This community has met every two years at national metrology institutes, starting with the initial meeting in 2003 at the National Institute of Standards and Technology (NIST, Gaithersburg), followed by the meetings at the National Physics Laboratory (NPL) in 2005, at the L'Istituto Nazionale di Ricerca Metrologica (INRiM) in 2007 and at the National Institute of Standards and Technology (NIST, Boulder) in 2009.
Citation
Journal of Modern Optics

Keywords

photon, single photon, single photon detector, quantum information, quantum key distribution, detection, fundamental physics

Citation

Kueck, S. , Migdall, A. , Degiovanni, I. and Cheung, J. (2012), Introduction to Journal of Modern Optics Special Issue on Single-Photon Devices and Applications, Journal of Modern Optics, [online], https://doi.org/10.1080/09500340.2012.744192, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912706 (Accessed December 1, 2021)
Created November 14, 2012, Updated October 12, 2021